The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Feb. 07, 2020
Applicant:
Nec Corporation, Tokyo, JP;
Inventor:
Hiroo Ikeda, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/62 (2022.01); G06T 7/70 (2017.01); G06V 20/52 (2022.01);
U.S. Cl.
CPC ...
G06V 10/62 (2022.01); G06T 7/70 (2017.01); G06V 20/53 (2022.01); G06T 2207/30196 (2013.01);
Abstract
A queue analysis apparatus () estimates a position and an orientation of each object () included in a target image (). The target image () is generated by a camera () that captures the object (). The queue analysis apparatus () generates a queue line () that expresses, by a linear shape, a queue included in a queue region () being a region representing a queue in the target image (), based on a position and an orientation being estimated for each object () included in the queue region ().