The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Jan. 30, 2023
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Sagar Mandava, Atlanta, GA (US);

Robert Marc Lebel, Calgary, CA;

Michael Carl, San Marcos, CA (US);

Florian Wiesinger, Freising, DE;

Assignee:

GE Precision Healthcare LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G01R 33/48 (2006.01); G01R 33/56 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); G01R 33/4824 (2013.01); G01R 33/5608 (2013.01); G06N 3/08 (2013.01); G06T 2210/41 (2013.01);
Abstract

A computer-implemented method for generating a chemical shift artifact corrected reconstructed image from magnetic resonance imaging (MRI) data includes inputting into a trained deep neural network an image generated from the MRI data acquired during a non-Cartesian MRI scan of a subject. The method also includes utilizing the trained deep neural network to generate the chemical shift artifact corrected reconstructed image from the image, wherein the trained deep neural network was trained utilizing a tissue mixing model that models interactions between different tissue types to mitigate chemical shift artifacts. The method further includes outputting from the trained deep neural network the chemical shift artifact corrected reconstructed image.


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