The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Mar. 21, 2023
Aisin Shiroki Corporation, Fujisawa, JP;
Tamadic Co., Ltd., Tokyo, JP;
Shinya Hirano, Nisshin, JP;
Tact System Co., Ltd., Komaki, JP;
Yu Okumura, Fujisawa, JP;
Naofumi Matsushita, Fujisawa, JP;
Junya Nakamura, Fujisawa, JP;
Tomokazu Uchiyama, Fujisawa, JP;
Shinji Fujino, Tokyo, JP;
Motohiro Kakureya, Tokyo, JP;
Kohei Yagi, Tokyo, JP;
Shinya Hirano, Nisshin, JP;
Hitoshi Fujiyama, Komaki, JP;
AISIN SHIROKI CORPORATION, Fujisawa, JP;
TAMADIC Co., Ltd., Tokyo, JP;
[object Object];
TACT SYSTEM Co., Ltd., Aichi-ken, JP;
Abstract
There is provided a target detection method and detection device that can detect a target by a simple method and configuration. A target detection method includes: a step of, at a first position information generation device, measuring a position and a posture of a first target; a step of, at a second position information generation device, measuring the position and the posture of the first target; a step of calculating a position and a posture of one of the first position information generation device and the second position information generation device with respect to other one of the first position information generation device and the second position information generation device based on a difference between the position and the posture of the first target measured by the first position information generation device, and the position and the posture of the first target measured by the second position information generation device; and a step of, at the second position information generation device, measuring a position and a posture of a second target using the position and the posture of the one of the first position information generation device and the second position information generation device with respect to the other one of the first position information generation device and the second position information generation device.