The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Sep. 15, 2022
Applicant:
Deere & Company, Moline, IL (US);
Inventors:
Nathan R. Vandike, Geneseo, IL (US);
Brian J. Gilmore, Davenport, IA (US);
Dinesh V. Phatak, Pune, IN;
David L. Wells, Bettendorf, IA (US);
Mahesh S. Bothe, Kopargaon, IN;
Assignee:
Deere & Company, Moline, IL (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); A01B 79/00 (2006.01); A01D 41/127 (2006.01); G06T 7/00 (2017.01); G06V 10/44 (2022.01); G06V 10/82 (2022.01); G06V 20/56 (2022.01); G06V 20/20 (2022.01); G06V 20/68 (2022.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); A01B 79/005 (2013.01); A01D 41/127 (2013.01); G06T 7/0002 (2013.01); G06V 10/454 (2022.01); G06V 10/82 (2022.01); G06V 20/56 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30128 (2013.01); G06T 2207/30188 (2013.01); G06T 2207/30242 (2013.01); G06V 20/20 (2022.01); G06V 20/68 (2022.01);
Abstract
A crop residue monitoring system may include a harvester, a camera to capture an image of crop residue generated by the harvester, an analytical unit to derive a value for a crop residue parameter of the crop residue based upon an optical analysis of the image and a control unit to adjust a subsequent field operation based upon the value of the crop residue parameter.