The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Aug. 26, 2021
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Ludmila Natanzon, Haifa, IL;
Liran Goshen, Pardes-Hanna, IL;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 11/008 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20076 (2013.01); G06T 2210/41 (2013.01);
Abstract
A computer system (MD) and relates method for spectral-data based material decomposition. The system comprises a statistical module (SM) configured to fit, per patch in input spectral imagery, a set of probability distributions (Pk) to a respective vector spectral diagram () for the respective patch (A). The patch is one of a plurality of patches in the input spectral imagery obtained by operation of a spectral imaging apparatus. The probability distributions are combinable into a probability map indicative of material type probabilities per image location in the input spectral imagery.