The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Nov. 27, 2021
ML Technology Ltd., New Taipei, TW;
Chi-Heng Lu, New Taipei, TW;
Chia-Liang Hsu, New Taipei, TW;
Ching-Hung Liang, New Taipei, TW;
Chang-Yu Wang, New Taipei, TW;
Ming-Chen Hsu, New Taipei, TW;
ML TECHNOLOGY LTD., New Taipei, TW;
Abstract
A testing system for an image processing algorithm including a control unit, an image processing device, an image processing hardware, and a testing device is disclosed. The control unit provides an original image and parameters. The image processing device obtains the original image and the parameters, and drives the image processing hardware to perform a first image processing procedure to the original image based on the parameters to generate a hardware-processed image. The testing device obtains the original image, the parameters, and the hardware-processed image, and performs, through a simulation software, a second image processing procedure to the original image based on the parameters to generate a software-processed image. The testing device compares the hardware-processed image with the software-processed image through a testing software to generate a comparing result that shows a pixel difference of the hardware-processed image and the software-processed image.