The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Jun. 28, 2019
Applicant:

Shape Security, Inc., Mountain View, CA (US);

Inventors:

Samir Shah, San Francisco, CA (US);

Bei Zhang, San Jose, CA (US);

Kenton Miller, Sunnyvale, CA (US);

Assignee:

Shape Security, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01); G06N 5/01 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01); G06N 5/01 (2023.01); G06N 20/00 (2019.01);
Abstract

In an embodiment, a computer-implemented method for training a decision tree using a database system, the decision tree comprising a plurality nodes, comprises, by one or more computing devices: storing in a database input data for training the decision tree, the input data comprising a plurality of feature values corresponding to a plurality of features; generating a particular node of the plurality of decision nodes by: selecting a subset of the plurality of features and a subset of the input data; using one or more queries to the database system, for each feature of the subset of the plurality of features, calculating a variance value associated with the feature based on the subset of the input data; identifying a particular feature of the subset of the plurality of features associated with the highest variance value; associating the particular node with the particular feature, wherein the particular node causes the decision tree to branch based on the particular feature.


Find Patent Forward Citations

Loading…