The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Dec. 09, 2022
Applicant:

Micro Focus Llc, Santa Clara, CA (US);

Inventors:

Yan-Jun Yu, Shanghai, CN;

Qian-Ru Zhai, Shanghai, CN;

Ye Jiang, Shanghai, CN;

Assignee:

Micro Focus LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/368 (2013.01); G06F 11/3688 (2013.01);
Abstract

Input data is received from an analysis of an application running in a real-world environment. The input data identifies one or more parameters that are associated with one or more test scripts that are used to test a new version of the application running in the real-world environment. One or more inputs are received that map the received input data to the one or more test scripts. The one or more test scripts are used to test the new version of the application. The one or more tests scripts are executed against the new version of the application based on the one or more parameters.


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