The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Feb. 15, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Keith Donald Cramer, Pine Island, MN (US);

Priya Ajay Ingle, Austin, TX (US);

Ramkumar Gowrishankar, Apex, NC (US);

Jiawei Wen, Cedar Park, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/50 (2006.01); G06F 11/3698 (2025.01);
U.S. Cl.
CPC ...
G06F 9/5055 (2013.01); G06F 11/3698 (2025.01);
Abstract

Processing within a computing environment is facilitated by determining a set of microservices needed to execute a microservice test suite in a test environment, where the test environment is an active microservice test environment with a plurality of microservices. The process also includes determining that the test environment lacks sufficient resources to run the microservice test suite with the set of microservices, and dynamically removing at least one microservice of the plurality of microservices from the test suite not needed to execute the microservice test suite to free test environment resources for executing the microservice test suite with the set of microservices. The process also includes initiating executing, based on the dynamically removing, the microservice test suite in the test environment.


Find Patent Forward Citations

Loading…