The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Sep. 25, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Ming Zhang, Beijing, CN;

Chen Gong, Beijing, CN;

Sheng Wang, Beijing, CN;

Huan Chen, Beijing, CN;

Jian Liu, Beijing, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0608 (2013.01); G06F 3/064 (2013.01); G06F 3/0673 (2013.01);
Abstract

Techniques perform data detection. Such techniques involve determining, based on a start sector address of a first mapping range composed of sectors in a physical address space, a first mapping region where the start sector address is located, the first mapping range corresponding to a first virtual block. Such techniques further involve comparing the first mapping region with a second mapping region, a second mapping range corresponding to a second virtual block different from the first virtual block at least partially corresponding to the second mapping region. Such techniques further involve comparing the first mapping range with the second mapping range in response to the first mapping region being the same as the second mapping region. Such techniques further involve determining that the first mapping range overlaps the second mapping range in response to that the first mapping range and the second mapping range have a common range.


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