The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Feb. 18, 2022
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Gen Fukatsu, Osaka, JP;

Tetsuya Miyasaka, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/05 (2006.01); G05B 19/04 (2006.01);
U.S. Cl.
CPC ...
G05B 19/058 (2013.01); G05B 19/0405 (2013.01);
Abstract

The present invention aims to efficiently perform analysis from enormous data by utilizing information other than a device and a variable held by a basic unit. In addition, another object thereof is to extract and report important data from an analysis result of the enormous data. An analysis apparatus includes: a storage section that stores PLC information different from a symbol value among pieces of information associated with a programmable logic controller; an execution engine that repeatedly executes a user program; an acquisition section that acquires operation record data including a plurality of time-series symbol values, the operation record data being collected by execution of the user program; and a processing section that outputs an analysis report obtained by analyzing an abnormal symbol that does not satisfy a normal condition regarding the acquired operation record data based on the PLC information stored in the storage section.


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