The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Oct. 05, 2023
GE Precision Healthcare Llc, Waukesha, WI (US);
Richard Scott Hinks, Sandia Park, NM (US);
Andreas Ebel, Waukesha, WI (US);
Hua Li, Sussex, WI (US);
GE Precision Healthcare LLC, Wauwatosa, WI (US);
Abstract
A system and a method for measuring eddy currents with long time constants includes initiating, via a processor, a calibration scan of a phantom utilizing a magnetic resonance imaging (MRI) scanner. The system and the method also include utilizing, via the processor, a train of gradient echo sequences to simultaneously generate and measure the eddy currents during the calibration scan. Both eddy current generation and measurement are completed within each gradient echo sequence of the train of gradient echo sequences. The system and the method further include acquiring, via the processor, k-space data from the train of gradient echo sequences. The system and the method still further include converting, via the processor, the k-space data to eddy current gradient fields. The system and the method even further include estimating, via the processor, the eddy currents as a function of time based on the eddy current gradient fields.