The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

May. 05, 2023
Applicant:

Asahi Intecc Co., Ltd., Seto, JP;

Inventor:

Satoru Nebuya, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/24 (2006.01); A61B 5/0536 (2021.01); A61B 5/055 (2006.01); G01R 33/44 (2006.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
G01R 33/24 (2013.01); A61B 5/0536 (2013.01); A61B 5/055 (2013.01); G01R 33/443 (2013.01); G01R 33/543 (2013.01);
Abstract

A measurement apparatus including: a static magnetic field applying part that applies a static magnetic field having a constant magnitude in a first direction to a measurement target; a plurality of current applying parts applying a plurality of AC currents oriented in a plurality of directions toward a portion of the measurement target via an electrode pair; a magnetic field detecting element that detects a magnitude of a magnetic field generated from the portion of the measurement target in response to the static magnetic field having the constant magnitude in the first direction and the plurality of AC currents; a calculating part for calculating impedance of the portion of the measurement target; and an internal information output part for generating information including an internal component of the measurement target.


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