The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Dec. 24, 2020
Applicants:

L'air Liquide Societe Anonyme Pour L'etude ET L'exploitation Des Procedes Georges Claude, Paris, FR;

Ekoscan, Saint Remy, FR;

Inventors:

Hugo Cence, Saint Remy, FR;

Valentin Perret, Saint Remy, FR;

Olivier Bardoux, Les Loges-en Josas, FR;

Daniel Gary, Les Loges-en Josas, FR;

Sophie Wastiaux, Champigny-sur-Marne, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/06 (2006.01); G01N 29/04 (2006.01); G01N 29/07 (2006.01); G01N 29/28 (2006.01);
U.S. Cl.
CPC ...
G01N 29/06 (2013.01); G01N 29/041 (2013.01); G01N 29/043 (2013.01); G01N 29/07 (2013.01); G01N 29/28 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/263 (2013.01);
Abstract

A method of monitoring a portion of an equipment under pressure implementing a control station to control an ultrasonic non-destructive testing device through a remote network, includes: the control station sends a first measurement request to the non-destructive testing device; the control station receives a first plurality of measurement data from the non-destructive testing device, constructs a first mapping of the portion of the structure from the data; sends a second measurement request to the non-destructive testing device, receives a second plurality of measurement data from the non-destructive testing device, constructs a second mapping of the portion of the structure, from the second plurality of measurement data, and compares the first mapping and the second mapping.


Find Patent Forward Citations

Cence, Hugo. (2025). Method for monitoring the change over time of a defect in a structure (U.S. Patent No. 12405250). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12405250

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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