The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Jan. 14, 2021
Jfe Steel Corporation, Tokyo, JP;
JFE Steel Corporation, Tokyo, JP;
Abstract
A surface inspection method includes: an irradiating step of emitting oblique illumination light onto an inspection target region of steel material using two or more oblique line light sources; an imaging step of receiving each of reflected light beams of the oblique illumination light from the respective oblique line light sources, the reflected light beams being from the inspection target region, and capturing images of the inspection target region, by one or more line sensors; and a detecting step of detecting a linear surface defect at the inspection target region using the images captured at the imaging step, wherein orthographic projections of at least two oblique illumination light beams, out of the oblique illumination light from the two or more oblique line light sources, onto a surface of the steel material are orthogonal to each other on the inspection target region.