The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Apr. 14, 2023
Applicant:
Photothermal Spectroscopy Corp., Santa Barbara, CA (US);
Inventors:
Craig Prater, Santa Barbara, CA (US);
Derek Decker, Carmel, CA (US);
David Grigg, Santa Barbara, CA (US);
Assignee:
Photothermal Spectroscopy Corp., Santa Barbara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/3563 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01);
Abstract
Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.
Prater, Craig. (2025). Asymmetric quadrature interferometry for thin film interference suppression in optical photothermal infrared spectroscopy (U.S. Patent No. 12405215). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12405215
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile