The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Dec. 08, 2021
Shimadzu Corporation, Kyoto, JP;
Takashi Ono, Kyoto, JP;
Masahiro Ihara, Kyoto, JP;
Hiromasa Maruno, Kyoto, JP;
Satoshi Matsuoka, Kyoto, JP;
Eri Matsutani, Kyoto, JP;
Yusuke Koga, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
One mode of an optical inspection apparatus according to the present invention is an optical inspection apparatus for optically inspecting an object, the optical inspection apparatus including: a biasing section () configured to apply, to a group of objects (A) on a stage, a force for moving the group of objects away with respect to the stage (); a catching section () including an adhesion portion () to which an object in the group of objects moved from the stage adheres; and an analysis section () configured to optically analyze the object caught by the catching section. This makes it possible to efficiently and satisfactorily perform optical analysis of individual microplastics by eliminating manual work of picking up the microplastics one by one.