The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Feb. 19, 2020
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Deblina Sarkar, Cambridge, MA (US);

Edward Stuart Boyden, Chestnut Hill, MA (US);

Asmamaw T. Wassie, Boston, MA (US);

Jinyoung Kang, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/36 (2006.01); G01N 1/28 (2006.01);
U.S. Cl.
CPC ...
G01N 1/36 (2013.01); G01N 1/28 (2013.01); G01N 1/286 (2013.01); G01N 2001/2873 (2013.01);
Abstract

The present invention provides biological samples of interest that have been iteratively expanded in a method referred to herein as iterative direct expansion microscopy (id-ExM). In the id-ExM method, biological samples of interest are permeated with a swellable material that results in the sample becoming embedded in the swellable material, and then the sample can be expanded isotropically in three dimensions. The process of iteratively expanding the samples can be applied to expand samples one or more additional times such that, for example, a 5-fold expanded sample can be expanded again to achieve high expansion factors, for example, 20× to 100× or more linear expansion.


Find Patent Forward Citations

Loading…