The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Apr. 11, 2023
Applicant:

Hyo Jin Kim, Seongnam-si, KR;

Inventors:

Sang Jeon Park, Anyang-si, KR;

Kyung Sek Song, Anyang-si, KR;

Hyo Jin Kim, Seongnam-si, KR;

Tae Hun Kim, Cheonan-si, KR;

Assignee:

[object Object];

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0235 (2013.01); G01M 11/0207 (2013.01);
Abstract

A lensmeter capable of measuring near-infrared ray transmittance of an eyeglass lens by adding a near-infrared ray measurement function to the lensmeter. The lensmeter includes a near-infrared ray transmittance measuring unit that includes a light emitting unit including a near-infrared ray light source for irradiating a measured lens with a near-infrared ray; and a light receiving unit including a near-infrared ray sensor for measuring a near-infrared ray transmittance of the measured lens by detecting an intensity of the near-infrared ray passing through the measured lens, and is located at one end of a housing of the lensmeter.


Find Patent Forward Citations

Loading…