The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Apr. 04, 2022
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Yue-Kai Huang, Princeton, NJ (US);
Ezra Ip, West Windsor, NJ (US);
Ting Wang, West Windsor, NJ (US);
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); G01D 5/353 (2006.01); H04B 10/071 (2013.01); H04B 10/61 (2013.01); H04J 14/00 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35361 (2013.01); H04B 10/071 (2013.01); H04B 10/61 (2013.01);
Abstract
Aspects of the present disclosure describe systems and methods that advantageously enable vibration-induced optical phase measurement at a centralized optical line terminal (OLT) in a PON architecture. In sharp contrast to existing distributed fiber sensing systems and methods, the optical phase measurements of the present disclosure do not rely on back scattering mechanisms and maintain a sufficient optical signal to noise ratio (OSNR) even after round-trip splitting loss in the PON.