The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Apr. 21, 2023
Nabtesco Corporation, Tokyo, JP;
Osamu Nohara, Tokyo, JP;
Hirofumi Komori, Tokyo, JP;
NABTESCO CORPORATION, Tokyo, JP;
Abstract
A backlash measuring method is provided for measuring backlash at a plurality of different times. The backlash measuring method includes: a rotation amount calculating step of braking a ring gear relative to a second portion while contact between a target tooth and the ring gear achieved in a contacting step is maintained, causing a target pinion to rotate toward a second side in a rotation direction opposite to the first side with a driving force less than a braking force applied to brake the ring gear relative to the second portion until the target tooth touches the ring gear at a tooth surface facing the second side, and calculating an amount of rotation of the target pinion; and a measuring step of measuring backlash between the ring gear and the target pinion based on the amount of rotation of the target pinion calculated in the rotation amount calculating step.