The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2025

Filed:

Dec. 19, 2019
Applicant:

Sanyo Electric Co., Ltd., Osaka, JP;

Inventors:

Yoshitaka Sakiyama, Hyogo, JP;

Noriharu Kobayashi, Hyogo, JP;

Hidetsugu Mukae, Hyogo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B60L 3/00 (2019.01); G01R 31/3835 (2019.01); G01R 31/396 (2019.01); G07C 5/08 (2006.01); H01M 10/48 (2006.01); H01M 50/51 (2021.01); H04L 67/12 (2022.01);
U.S. Cl.
CPC ...
B60L 3/0046 (2013.01); G01R 31/3835 (2019.01); G01R 31/396 (2019.01); G07C 5/0808 (2013.01); H01M 10/48 (2013.01); H01M 10/482 (2013.01); H01M 50/51 (2021.01); B60L 2240/547 (2013.01); H01M 2220/20 (2013.01); H04L 67/12 (2013.01);
Abstract

Controller performs a plurality of pieces of abnormality diagnosing processing in a vehicle. The plurality of pieces of abnormality diagnosing processing includes a first-type abnormality diagnosing processing of detecting the abnormality that occurs due to a plurality of types of causes and a second-type abnormality diagnosing processing of detecting the abnormality that occurs due to one type of cause. When the abnormality is detected by the first-type abnormality diagnosing processing, controller specifies the cause of the abnormality detected by the first-type abnormality diagnosing processing based on a diagnosis result of the second-type abnormality diagnosing processing.


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