The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2025
Filed:
Jul. 03, 2024
Applicant:
Gyrus Acmi, Inc., Westborough, MA (US);
Inventors:
Vladimir Polejaev, Middletown, CT (US);
Kurt G. Shelton, Bedford, MA (US);
Assignee:
Gyrus ACMI, Inc., Westborough, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/05 (2006.01); A61B 1/06 (2006.01); A61B 1/07 (2006.01); A61B 1/313 (2006.01); G06T 7/521 (2017.01); G06T 15/80 (2011.01); H04N 23/50 (2023.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
A61B 1/0005 (2013.01); A61B 1/063 (2013.01); A61B 1/0669 (2013.01); A61B 1/07 (2013.01); A61B 1/313 (2013.01); G06T 7/521 (2017.01); G06T 15/80 (2013.01); H04N 23/56 (2023.01); A61B 1/05 (2013.01); G06T 2207/10068 (2013.01); H04N 23/555 (2023.01);
Abstract
Techniques for detecting depth contours of an anatomical target and for enhancing imaging of the anatomical target are provided. In an example, a reference pattern of light can be projected across an anatomical target and an image of the reflected light pattern upon the anatomical target can be captured. The captured light pattern can be analyzed to determine contour information, which can then be used to provide 3D cues to enhance a 2-dimensional image of the anatomical target.