The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

May. 23, 2022
Applicant:

Zte Corporation, Shenzhen, CN;

Inventor:

Kun Niu, Shenzhen, CN;

Assignee:

ZTE CORPORATION, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04B 17/17 (2015.01);
U.S. Cl.
CPC ...
H04L 1/0003 (2013.01); H04B 17/17 (2015.01); H04L 1/0026 (2013.01);
Abstract

Disclosed are an Error Vector Magnitude (EVM) measurement method, a transmitter, and a computer-readable storage medium. The EVM measurement method includes: acquiring a cell configuration parameter from a control terminal device; generating a test data source according to the cell configuration parameter; obtaining a measurement signal according to the test data source; determining an error vector magnitude according to the measurement signal and a preset reference signal; and sending the error vector magnitude to the control terminal device, wherein the control terminal device determines whether there is any abnormality in RF indicators of the transmitter according to the error vector magnitude.


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