The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Aug. 04, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Ahmad Alammouri, Richardson, TX (US);

Jianhua Mo, Allen, TX (US);

Mustafa Furkan Ozkoc, Plano, TX (US);

Boon Loong Ng, Plano, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04K 1/10 (2006.01); H04B 7/06 (2006.01); H04B 17/327 (2015.01); H04L 27/28 (2006.01);
U.S. Cl.
CPC ...
H04B 7/06952 (2023.05); H04B 7/0639 (2013.01); H04B 17/327 (2015.01);
Abstract

A method includes identifying child beams of a current composite beam. The method also includes determining an order at which the child beams of the current composite beam are measured based on a likelihood that each child beam of the current composite beam is an optimal beam, among the child beams, to be a serving narrow beam. The method also includes determining a threshold for use in deciding whether to measure one or more additional child beams or select an already measured child beam when selecting the optimal beam. The method also includes selecting the optimal beam, among the child beams, to be the serving narrow beam based on the determined order and the determined threshold.


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