The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Dec. 30, 2019
Koninklijke Philips N.v., Eindhoven, NL;
Tobias Wissel, Lübeck, DE;
Irina Waechter-Stehle, Hamburg, DE;
Frank Michael Weber, Hamburg, DE;
Arne Ewald, Hamburg, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
An image analysis method and device is for detecting failure or error in an image segmentation procedure. The method comprises comparing () segmentation outcomes for two or more images, representative of a particular anatomical region at different respective time points, and identifying a degree of consistency or deviation between them. Based on this derived consistency or deviation measure, a measure of accuracy of the segmentation procedure is determined ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile