The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Mar. 28, 2024
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Shinya Ukai, Fujimi-machi, JP;

Akira Morita, Chino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G01R 27/26 (2006.01); G09G 3/36 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G01R 27/2605 (2013.01); G09G 3/3688 (2013.01); G09G 2330/12 (2013.01);
Abstract

A control circuit couples a test capacitance element Cp and a node Test to a capacitance element Cm-to be tested, and applies a voltage output from an operational amplifier circuit to the capacitance elements Cm-and Cp and the node Test. Thereafter, the capacitance element Cp and the node Test are decoupled from the capacitance element Cm-to be tested, the capacitance element and the node Test are coupled to the capacitance element Cm-, the charge accumulated in the capacitance element Cm-is moved, a voltage Vref of a negative input-end (−) of a comparison circuit is set, and the capacitance element Cm-is tested based on a signal output from the comparison circuit.


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