The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Dec. 14, 2021
Applicant:
Spreeai Corporation, Incline Village, NV (US);
Inventor:
Dmitriy Vladlenovich Pinskiy, Woodland Hills, CA (US);
Assignee:
SpreeAI Corporation, Incline village, NV (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/20 (2006.01); G06T 13/40 (2011.01); G06T 15/04 (2011.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G06T 17/20 (2013.01); G06T 13/40 (2013.01); G06T 15/04 (2013.01); G06T 19/20 (2013.01); G06T 2210/16 (2013.01); G06T 2219/2021 (2013.01);
Abstract
Computer implemented measurement space deformation method and apparatus. A method embodiment comprises defining a measurement space as a multi-dimensional space, populating the measurement space with a set of pre-computed example avatars, searching the measurement space for a subset of example avatars, and interpolating between the example avatars of the subset.