The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Jan. 06, 2021
Fanuc Corporation, Yamanashi, JP;
Yuuki Sugita, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A workpiece image analyzing device is provided with: a display unit for displaying an image of a workpiece to be processed by an industrial machine; an analysis object designating unit for accepting designation of an analysis object with respect to the image of the workpiece; a feature extracting unit for extracting, in a real-world coordinate system, structural features of the analysis object designated by the analysis object designating unit; an analysis item setting unit for accepting designation of an analysis item with respect to the image of the workpiece; and a physical quantity calculating unit which extracts, from the structural features of the analysis object, a feature required for calculating a physical quantity pertaining to the analysis item designated by the analysis item setting unit, and calculates the physical quantity using the extracted feature.