The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Dec. 20, 2021
Applicant:
Future Dial, Inc., Sunnyvale, CA (US);
Inventors:
Jisheng Li, Los Altos, CA (US);
George Huang, Los Altos Hills, CA (US);
Assignee:
Future Dial, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); G06N 5/02 (2023.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01); G06T 7/00 (2017.01); H04N 23/74 (2023.01); H04N 23/90 (2023.01); H04M 1/725 (2021.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06N 5/027 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); H04N 23/74 (2023.01); H04N 23/90 (2023.01); G06T 2207/20081 (2013.01); H04M 1/725 (2013.01);
Abstract
A method for automatically inspecting and grading a device includes generating an artificial intelligence (AI) grading model based on a plurality of grade criteria associated with a plurality of models of devices. The method further includes capturing a set of one or more images of the device; and grading the device based on the set of one or more images of the device using the AI grading model.