The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Nov. 01, 2022
University of Maryland, College Park, College Park, MD (US);
Government of the United States of America As Represented BY the Secretary of Commerce, Gaithersburg, MD (US);
Jacob Bringewatt, Hyattsville, MD (US);
Przemyslaw Bienias, San Francisco, CA (US);
Timothy Qian, Rockville, MD (US);
Igor Boettcher, Washington, DC (US);
Alexey Gorshkov, Potomac, MD (US);
University of Maryland, College Park, College Park, MD (US);
Government of the United States of America as Represented by the Secretary of Commerce, Gaithersburg, MD (US);
Abstract
A system for the measurement of field properties includes a quantum system, a processor, and a memory. The quantum system includes a plurality of quantum sensors coupled to a field. Each sensor of the plurality of quantum sensors is located at a position in the field. The position depends on parameters. Each sensor of the plurality of quantum sensors is entangled. The memory includes instructions stored thereon, which, when executed by the processor, cause the quantum system to: access a signal of the quantum system; sense a plurality of interdependent a local field amplitudes corresponding to the plurality of quantum sensors by locally probing the field by each sensor of the plurality of quantum sensors; estimate a function of the parameters at a position x, where xis a position without a quantum sensor of the plurality of quantum sensors; and estimate an amplitude of the field at the position xbased on the estimated function of the parameters.