The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Oct. 05, 2022
Applicant:

Universität Zürich, Zürich, CH;

Inventors:

Yuhuang Hu, Zürich, CH;

Shih-Chii Liu, Zürich, CH;

Assignee:

UNIVERSITÄT ZÜRICH, Zürich, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06N 3/045 (2023.01); G06N 3/048 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/045 (2023.01); G06N 3/048 (2023.01);
Abstract

A computer-implemented method is used to adapt a first artificial neural network for data classification tasks. The first artificial neural network is characterized by a first number of first weight parameters, and includes a set of first network layers. The method includes freezing at least some of the first weight parameters of the first neural network to obtain frozen first weight parameters and duplicating the frozen first weight parameters to obtain duplicated first weight parameters. A second artificial neural network is applied to the duplicated first weight parameters to obtain modulated first weight parameters. The second artificial neural network is characterized by a second number of second weight parameters, the second number being smaller than the first number. The frozen first weight parameters are replaced in the first neural network with the modulated first weight parameters to obtain a modulated first artificial neural network adapted for a data classification task.


Find Patent Forward Citations

Hu, Yuhuang. (2025). Parameter-efficient method for training neural networks (U.S. Patent No. 12400117). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12400117

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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