The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Apr. 15, 2021
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Makoto Onodera, Tokyo, JP;

Yuki Itabayashi, Tokyo, JP;

Masayuki Hariya, Tokyo, JP;

Chikara Kongou, Tokyo, JP;

Masaki Shintani, Tokyo, JP;

Hiroki Kawamoto, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/12 (2020.01); G06F 111/02 (2020.01); G06F 111/20 (2020.01);
U.S. Cl.
CPC ...
G06F 30/12 (2020.01); G06F 2111/02 (2020.01); G06F 2111/20 (2020.01);
Abstract

Generation of a search key shape for identifying a dedicated shape with respect to three-dimensional CAD data is facilitated. A shape group registration unit registers multiple pieces of three-dimensional CAD data; a feature amount computation unit computes a feature amount with respect to each of the registered pieces of three-dimensional CAD data; a clustering unit clusters the pieces of three-dimensional CAD data based on a feature amount; a cluster center computation unit determines a feature amount of a cluster center of each cluster from a feature amount of three-dimensional CAD data; and a search key shape registration unit registers feature amount data of a cluster center as feature amount data of a search key shape.


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