The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Jun. 30, 2023
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Rui Ding, Redmond, WA (US);
Zhouyu Fu, Redmond, WA (US);
Shi Han, Redmond, WA (US);
Haidong Zhang, Redmond, WA (US);
Dongmei Zhang, Redmond, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
According to implementations of the subject matter described herein, there is proposed a solution for automatic analysis of a difference between multi-dimensional datasets. In this solution, an analysis request is received for a first dataset and a second dataset, each of which including data items corresponding to a plurality of dimensions. In response to the analysis request, data items corresponding to a first dimension in the first and second datasets are compared. Based on the comparison, a first set of influence factors associated with the first dimension are determined, each influence factor indicating a reason for a difference between the first and second datasets from a respective perspective. An analysis result related to the difference between the first and second datasets is presented based on the first set of influence factors. In this way, it is possible to achieve automatic and efficient analysis of the difference between the different datasets.