The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Feb. 05, 2024
Applicant:
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Inventors:
John M. Connelly, Cedar Rapids, IA (US);
Nisar Ahemad Naikwadi, Cedar Rapids, IA (US);
Joseph A. Steffen, Cedar Falls, IA (US);
Assignee:
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/1027 (2016.01); G06F 11/07 (2006.01); G06F 12/1009 (2016.01);
U.S. Cl.
CPC ...
G06F 12/1027 (2013.01); G06F 11/073 (2013.01); G06F 12/1009 (2013.01); G06F 2212/1032 (2013.01);
Abstract
A microprocessor is described. The microprocessor includes a software-based monitor for detecting TLB corruptions. The TLB corruptions contribute to undetected erroneous upset rate of the microprocessor. The software monitor detects errors in the TLB. The software-based monitor detects TLB corruptions in microprocessors where hardware protection mechanisms are not available. The software monitor mitigates single event effects due to atmospheric particles and improves the safety of high integrity computing products.