The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Jul. 09, 2021
Applicant:
Harness Inc., San Francisco, CA (US);
Inventors:
Shivakumar Ningappa, Milpitas, CA (US);
Uri Scheiner, Pleasanton, CA (US);
Srinivas Bandi Ramesh Babu, Los Altos, CA (US);
Srinivasa Rao Gurubelli, Fremont, CA (US);
Assignee:
Harenss Inc., San Francisco, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2025.01); G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3684 (2013.01);
Abstract
A system that automatically reduces test cycle time to save resources and developer time. The present system selects a subset of tests from a full test plan that should be selected for a particular test cycle, rather than running the entire test plan. The subset of tests is intelligently selected using metrics such as tests associated with changed code and new and modified tests.