The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Sep. 29, 2021
Applicant:

Inspur Suzhou Intelligent Technology Co., Ltd., Jiangsu, CN;

Inventors:

Xiangsheng Kong, Shandong, CN;

Hui Wang, Shandong, CN;

Xianzhuang Li, Shandong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3051 (2013.01); G06F 11/3072 (2013.01);
Abstract

A large-scale K8s cluster monitoring method, an apparatus, a computer device, and a readable storage medium. The method includes: performing classification on data sources in a cluster on the basis of a monitoring metric configuration means, and creating a data list on the basis of the data sources and the monitoring metric configuration means corresponding to said data sources; in response to receiving a command to monitor a first monitoring metric set of a first data source, obtaining a monitoring metric configuration means corresponding to the first data source on the basis of the data list; performing configuration on a monitoring metric on the basis of the first monitoring metric set and by means of the obtained monitoring metric configuration means; and obtaining from the first data source a monitoring metric in the first monitoring metric set every preset amount of time, and performing monitoring on the monitoring metric.


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