The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Apr. 03, 2024
Applicant:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Inventors:

Divya Madapusi Srinivas Prasad, Santa Clara, CA (US);

Sudhanva Gurumurthi, Austin, TX (US);

Yasuko Eckert, Bellevue, WA (US);

Jeffrey Richard Rearick, Ft Collins, CO (US);

Sankaranarayanan Gurumurthy, Austin, TX (US);

Amitabh Mehra, Ft. Collins, CO (US);

Shidhartha Das, Milton Keynes, GB;

Alex W. Schaefer, Austin, TX (US);

Vikram Ramachandra, Austin, TX (US);

Vilas Sridharan, Boxborough, MA (US);

Assignee:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 1/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/07 (2013.01); G06F 1/30 (2013.01); G06F 11/0721 (2013.01);
Abstract

An exemplary computing device includes a plurality of circuits and/or a plurality of in-situ monitors configured to generate outputs that indicate one or more operating conditions of the circuits. The computing device also includes a system management unit configured to detect a potentially faulty voltage-to-frequency ratio implemented by one of the circuits based at least in part on one or more of the outputs. The system management unit is also configured to modify the potentially faulty voltage-to-frequency ratio based at least in part on one or more of the outputs. Various other devices, systems, and methods are also disclosed.


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