The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Feb. 28, 2024
Sap SE, Walldorf, DE;
Tim Breitenbach, Mitgenfeld, DE;
Patrick Jahnke, Leimen/Baden-Württemberg, DE;
SAP SE, Walldorf, DE;
Abstract
Systems and Methods for Automatically Detecting Root Cause Failures Described herein are techniques for automatically detecting root cause failures in a computing environment. A data center may experience a critical system failure that renders the data center inoperable. An administrator may utilize a root cause detector to analyze alerts generated from the data center to automatically detect the root cause of the critical system failure. Once detected, the administrator may investigate the device with the root cause failure to repair the data center. In some examples, the root cause detector may compare alerts received from the data center with root cause failures in a failure repository that it is familiar with to determine whether the present sequence of alerts is similar to alert patterns it has seen before. The root cause detector may be implemented with a classifier model, a large language model, a rule-based heuristics identifying spurious alert patterns, or combinations of these techniques.