The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Sep. 13, 2021
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Martin Pohlack, Dresden, DE;

Bjoern Doebel, Dresden, DE;

Norbert Manthey, Dresden, DE;

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 8/41 (2018.01); G06F 9/54 (2006.01); G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 8/44 (2013.01); G06F 21/577 (2013.01); G06F 11/3688 (2013.01); G06F 2221/033 (2013.01);
Abstract

Targeted dynamic analysis of code is provided by utilizing static analysis and dynamic analysis. A static code analysis system can operate to generate an initial analysis of code. The results of the initial analysis may be used to target a dynamic analysis system to analyze portions of code identified by the static analysis as potentially containing defects. In some cases, a preliminary dynamic analysis may be used to generate code inputs that may be utilized in future analyses to determine the inputs necessary to target particular code paths identified by a static analysis as potentially defective. Future updates to the code base may utilize the generated data to target analysis to code paths affected by the updates.


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