The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Apr. 26, 2022
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Qiyao Wang, Los Gatos, CA (US);

Wei Huang, Campbell, CA (US);

Ahmed Farahat, Santa Clara, CA (US);

Haiyan Wang, Fremont, CA (US);

Chetan Gupta, Sunnyvale, CA (US);

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4063 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4063 (2013.01); G05B 2219/14036 (2013.01);
Abstract

A method for detecting an anomaly in time series sensor data. The method may include identifying a noisiest cycle from the time series sensor data; for an evaluation of the noisiest cycle indicative of the anomaly being detected at a confidence level above a threshold, providing an output associated with the noisiest cycle as being the anomaly; and for the evaluation of the noisiest cycle indicative of the anomaly being detected at the confidence level not above the threshold: identifying a cycle from the time series sensor data having a most differing shape; and providing the output associated with the cycle having the most differing shape as being the anomaly.


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