The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Nov. 13, 2024
Applicant:

Guangzhou Institute of Geochemistry, Chinese Academy of Sciences, Guangzhou, CN;

Inventors:

Wei Tan, Guangzhou, CN;

Lianying Luo, Guangzhou, CN;

Mengqi Han, Guangzhou, CN;

Hongping He, Guangzhou, CN;

Jianxi Zhu, Guangzhou, CN;

Xiaoliang Liang, Guangzhou, CN;

Gaofeng Wang, Guangzhou, CN;

Xiaorong Qin, Guangzhou, CN;

Yilin He, Guangzhou, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/02 (2006.01); G06F 30/23 (2020.01);
U.S. Cl.
CPC ...
G01V 3/02 (2013.01); G06F 30/23 (2020.01);
Abstract

A method and a system for predicting an occurrence depth of a weathering crust-type rare earth deposit orebody are provided. The method includes: performing field test on a weathering crust by using a high-density electrical method; performing computational inversion on test results to obtain apparent resistivity data of the weathering crust at different depths; and correcting a distortion value of the apparent resistivity data due to terrain fluctuations based on a terrain of the weathering crust, obtaining apparent resistivity data of the weathering crust after terrain correction at different depths by using a ratio method, further obtaining a first-order derivative curve of the apparent resistivity versus depth changes, and determining the occurrence depth of the rare earth orebody by combining parameters of a logistic regression model.


Find Patent Forward Citations

Tan, Wei. (2025). Method and system for predicting occurrence depth of weathering crust-type rare earth deposit orebody (U.S. Patent No. 12399293). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12399293

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