The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

May. 16, 2022
Applicant:

Topcon Positioning Systems, Inc., Livermore, CA (US);

Assignee:

Topcon Positioning Systems, Inc., Livermore, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/07 (2010.01); G01S 19/14 (2010.01); G01S 19/29 (2010.01); G01S 19/37 (2010.01); G01S 19/39 (2010.01);
U.S. Cl.
CPC ...
G01S 19/072 (2019.08); G01S 19/14 (2013.01); G01S 19/29 (2013.01); G01S 19/37 (2013.01); G01S 19/396 (2019.08);
Abstract

Method of measuring ionosphere scintillation phase index Sigma-Phi, the method including, for each of N satellites being tracked, calculating a phase prediction at an i-th sample; for each of the N satellites, calculating an individual loop discriminator signal based on the phase prediction; rejecting the i-th samples of some of the N satellites, where K non-rejected satellites remain; calculating common loop discriminator signal based on the individual loop discriminator signals of non-rejected K satellites; calculating a phase estimate and a Doppler frequency estimate at the i-th sample for each of the N satellites based on individual loop discriminator signal; calculating test statistic based on the phase estimate at the i-th sample and an observed phase for each of the N satellites; calculating index Sigma-Phi as standard deviation estimation of the test statistic for each of the N satellites; and outputting the index Sigma-Phi for each of the N satellites.


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