The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Mar. 24, 2020
Nec Corporation, Tokyo, JP;
Taichi Tanaka, Tokyo, JP;
Osamu Hoshuyama, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
The image analyzing device calculates a phase difference image of a pair of images, calculates a phase difference between close pixels in the phase difference image, generates an evaluation function including a shooting time difference of the pair of images and taking a variable that is a displacement velocity difference of close pixels or an evaluation function including a baseline distance and taking a variable that is an elevation of close pixels, and optimizing the evaluation function for each pair of close pixels. The image analyzing device sets a threshold based on a result of evaluation of the random number using the evaluation function, and obtains merged data of an entire image by merging values of variables when performing optimization except for variables for which evaluation value using the evaluation function is below the threshold.