The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Jul. 22, 2021
Applicant:

Endress+hauser Se+co. KG, Maulburg, DE;

Inventors:

Pablo Ottersbach, Essen, DE;

Thomas Blödt, Steinen, DE;

Assignee:

ENDRESS+HAUSER SE+CO. KG, Maulburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/22 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01N 27/221 (2013.01); G01R 1/06711 (2013.01); G01R 1/06772 (2013.01);
Abstract

A high-frequency-based measuring device for determining a temperature-compensated dielectric constant of a medium includes a measuring probe having an electrically conductive inner conductor and an outer conductor. The inner conductor is rod-like along an axis. The inner wall of the outer conductor is symmetrical about the axis of the inner conductor and expands along the axis toward the medium. The measuring device includes a temperature sensor located in a first end region of the inner conductor, toward which end region the inner wall of the outer conductor expands. One of the temperature sensor terminals is at the potential of the inner conductor. The temperature of the medium is measured directly, without impairment of the high-frequency-based measurement of the dielectric constant. A highly accurate measurement of the dielectric constant and highly accurate temperature compensation are thereby made possible.


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