The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
May. 10, 2021
Volume Graphics Gmbh, Heidelberg, DE;
Sven Gondrom-Linke, Heidelberg, DE;
Matthias Flessner, Heidelberg, DE;
Thomas Günther, Heidelberg, DE;
Christoph Poliwoda, Heidelberg, DE;
Sören Schüller, Heidelberg, DE;
Christof Reinhart, Heidelberg, DE;
Daniela Handl, Heidelberg, DE;
VOLUME GRAPHICS GMBH, Heidelberg, DE;
Abstract
Described is a computer-implemented method for monitoring the status of a device for investigating objects, wherein the investigation of an object involves determining measurement data by measuring the object and operating data of the device is determined during the investigation of the object. The method includes: determining measurement data of the object by means of the device; determining operating data of the device during the determining measurement data of the object; determining at least one quality parameter from the measurement data; analysing the operating data and the at least one quality parameter; and determining a status characteristic value based on the analysing in order to monitor the status of the device, wherein the status characteristic value indicates a status of the device. The computer-implemented method comparatively easily monitors the functionality of devices for investigating objects during adaptive measurements.