The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Feb. 04, 2021
Applicant:

Southern University of Science and Technology, Guangdong, CN;

Inventors:

Fucai Zhang, Guangdong, CN;

Bingyang Wang, Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4788 (2013.01);
Abstract

A method for characterising an object, including: providing, via a support plane, coherent incident radiation at the object at each of a plurality of radiation configurations, detecting, at a detector, an intensity of radiation scattered by the object for each radiation configuration, and determining, via an iterative process, an object transmission function associated with the object in dependence on the detected intensity of radiation for each radiation configuration. The iterative process comprises estimating, for each radiation configuration, an entrance wave function and an exit wave function, a support constraint and a current estimate of the object transmission function, determining a ratio of a sum of intensities of the exit wave function for the plurality of radiation configurations to a sum of intensities of the entrance wave function therefor, and updating the estimate of the object transmission function in dependence on the determined ratio and an amplitude constraint.


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