The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Oct. 30, 2020
Applicant:

Unm Rainforest Innovations, Albuquerque, NM (US);

Inventors:

Steven R. J. Brueck, Albuquerque, NM (US);

Alexander Neumann, Albuquerque, NM (US);

Juan Jose Faria Briceno, Albuquerque, NM (US);

Assignee:

UNM RAINFOREST INNOVATIONS, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/47 (2013.01); G01N 2021/4735 (2013.01); G01N 2021/4792 (2013.01); G01N 2201/105 (2013.01);
Abstract

A method and system for high-speed 2Θ multi-point scatterometry is disclosed. The method includes directing a laser beam from a laser light source to a collimation optical system that collimates the laser beam to a collimated laser beam; adjusting a polarization of the collimated laser beam using a polarization control optics; directing the collimated laser beam that is polarized by a first optical system to illuminate a focal area on a sample surface; receiving reflected light from the focus of the laser light source at the sample surface by a second optical system; detecting the reflected light by a detector system to produce detection signals; and processing the detection signals to measure parameters of the sample surface.


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