The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Aug. 11, 2021
Applicant:
Allen Institute, Seattle, WA (US);
Inventors:
Gregory Johnson, Seattle, WA (US);
Chawin Ounkomol, Seattle, WA (US);
Forrest Collman, Seattle, WA (US);
Sharmishtaa Seshamani, Seattle, WA (US);
Michael Kranda, Seattle, WA (US);
Assignee:
ALLEN INSTITUTE, Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/0227 (2024.01); G01N 15/1429 (2024.01); G01N 15/1433 (2024.01); G01N 15/1434 (2024.01);
U.S. Cl.
CPC ...
G01N 15/0227 (2013.01); G01N 15/1429 (2013.01); G01N 15/1433 (2024.01); G01N 2015/1445 (2013.01);
Abstract
The present invention provides various methods for easily assessing cell quality of a cell production process, suitably using non-invasive visual methods and neural networks for generating predictive fluorescence images of cells to assess quality attributes. Also provided are systems and methods for carrying out such processes.
Johnson, Gregory. (2025). Systems, devices, and methods for quality control of cell production using predictive tagging (U.S. Patent No. 12399100). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12399100
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile