The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Dec. 18, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Daiki Ata, Tokyo, JP;

Tomo Ikuyama, Tokyo, JP;

Satoshi Namematsu, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G01K 1/143 (2021.01); G05B 23/02 (2006.01); G06T 7/00 (2017.01); G01J 5/00 (2022.01);
U.S. Cl.
CPC ...
B25J 9/163 (2013.01); B25J 9/1612 (2013.01); G01K 1/143 (2013.01); G05B 23/024 (2013.01); G06T 7/0008 (2013.01); G01J 2005/0077 (2013.01);
Abstract

A learning device and other techniques allow accurate diagnosis of a production facility. A learning device () includes a data acquirer that acquires data for learning, and a model generator that generates a learning model for inferring a condition of a workpiece () handled in a production facility () on the basis of the data for learning. The data for learning includes setting data indicating a setting of the production facility (), image data indicating an image of the production facility () captured by a camera (), temperature data indicating a surface temperature of the production facility () measured by a temperature sensor (), distance data indicating a distance from a range sensor () to the production facility () measured by the range sensor (), and condition data indicating the condition of the workpiece () handled in the production facility ().


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